Identification of Two New Loci for Adult Plant Resistance to Leaf Rust and Stripe Rust in the Chinese Wheat Variety 'Neimai 836'
文献类型： 外文期刊
作者： Zhou, Jingwei 1 ; Singh, Ravi P. 2 ; Ren, Yong 3 ; Bai, Bin 4 ; Li, Zhikang 1 ; Yuan, Chan 1 ; Li, Shunda 1 ; Huerta-Espino, Julio 5 ; Liu, Demei 6 ; Lan, Caixia 1 ;
作者机构： 1.Huazhong Agr Univ, Coll Plant Sci & Technol, 1 Hongshan Dist, Wuhan 430070, Hubei, Peoples R China
2.Int Maize & Wheat Improvement Ctr CIMMYT, Mexico City 06600, DF, Mexico
3.Mianyang Acad Agr Sci, Natl Wheat Improvement Ctr, Mianyang Branch, Mianyang 621023, Sichuan, Peoples R China
4.Gansu Acad Agr Sci, Wheat Res Inst, 1 Nongkeyuanxincun, Lanzhou 730070, Gansu, Peoples R China
5.Campo Expt Valle Mexico Inst Nacl Invest Forestal, Chapingo 56230, Edo De Mexico, Mexico
6.Chinese Acad Sci, Northwest Inst Plateau Biol, Xining 810008, Peoples R China
7.Innovat Acad Seed Design, Qinghai Prov Key Lab Crop Mol Breeding, Xining 810008, Peoples R China
8.Innovat Acad Seed Design, Northwest Inst Plateau Biol, China & Qinghai Prov Key Lab Crop Mol Breeding, Xining 810008, Peoples R China
关键词： colocated resistance loci; KASP markers; leaf rust; Puccinia triticina; Puccinia striiformis f. sp. tritici; QTL mapping; stripe rust; wheat
期刊名称：PLANT DISEASE （ 影响因子：4.614； 五年影响因子：5.33 ）
ISSN： 0191-2917
年卷期： 2021 年 105 卷 11 期
页码：
收录情况： SCI
摘要： The characterization of leaf rust (caused by Puccinia triticina) and stripe rust (caused by Puccinia striiformis f. sp. tritici) resistance genes is the basis for breeding resistant wheat varieties and managing epidemics of these diseases in wheat. A cross between the susceptible wheat variety 'Apay#1' and resistant variety 'Neimai 836' was used to develop a mapping population containing 148 F-5 recombinant inbred lines (RILs). Leaf rust phenotyping was done in field trials at Ciudad Obregon, Mexico, in 2017 and 2018, and stripe rust data were generated at Toluca, Mexico, in 2017 and in Mianyang, Ezhou, and Gansu, China, in 2019. Inclusive complete interval mapping (ICIM) was used to create a genetic map and identify significant resistance quantitative trait loci (QTL) with 2,350 polymorphic markers from a 15K wheat single-nucleotide polymorphism (SNP) array and simple-sequence repeats (SSR5). The pleiotropic multipathogen resistance gene Lr46/Yr29 and four QTL were identified, including two new loci, QLr.hzau-3BL and QY r.hzau5AL, which explained 3 to 16% of the phenotypic variation in resistance to leaf rust and 7 to 14% of that to stripe rust. The flanking SNP markers for the two loci were converted to Kompetitive Allele-Specific PCR (KASP) markers and used to genotype a collection of 153 wheat lines, indicating the Chinese origin of the loci. Our results suggest that Neimai 836, which has been used as a parent for many wheat varieties in China, could be a useful source of high-level resistance to both leaf rust and stripe rust.
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