文献类型： 外文期刊

作者： Wen, W. E. ² ; Li, G. Q. ¹ ; He, Z. H. ¹ ; Yang, W. Y. ⁴ ; Xu, M. L. ² ; Xia, X. C. ¹ ;

作者机构： 1.Chinese Acad Agr Sci, Inst Crop Sci, Natl Wheat Improvement Ctr, Natl Key Facil Crop Gene Resources & Genet Improv, Beijing 100081, Peoples R China

2.China Agr Univ, Coll Agron & Biotechnol, Beijing 100094, Peoples R China

3.Chinese Acad Agr Sci, Int Maize & Wheat Improvement Ctr, CIMMYT, China Off, Beijing 100081, Peoples R China

4.Sichuan Acad Agr Sci, Crop Res Inst, Chengdu 610066, Peoples R China

期刊名称：MOLECULAR BREEDING （ 影响因子：2.589； 五年影响因子：2.75 ）

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收录情况： SCI

摘要： The gene Yr26 confers resistance to all races of Puccinia striiformis f. sp. tritici (PST), the casual pathogen of wheat stripe rust in China. Here, we report development of a molecular marker closely linked to Yr26 using a resistance gene-analog polymorphism (RGAP) technique. A total of 787 F plants and 165 F lines derived from the cross Chuanmai 42/Taichung 29 were used for linkage analysis. Eighteen near-isogenic lines (NILs) and 18 Chinese wheat cultivars and advanced lines with different genes for stripe rust resistance were employed for the validation of STS markers. A total of 1,711 RGAP primer combinations were used to test the parents and resistant and susceptible bulks. Five polymorphic RGAP markers were used for genotyping all F plants. Linkage analysis showed that the five RGAP markers were closely linked to Yr26 with genetic distances ranging from 0.5 to 2.9 cM. These markers were then converted into STS markers, one, CYS-5, of which was located 0.5 cM to Yr26 and was closely associated with the resistance gene when validated over 18 NILs and 18 Chinese wheat cultivars and lines. The results indicated that CYS-5 can be used in marker-assisted selection targeted at pyramiding Yr26 and other genes for stripe rust resistance.